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Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 2

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索取号：TN1-53/E901/1990.2
作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989

Proceedings [electronic resource] : energy and information technologies in the Southeast : Southeastcon, April 1-4, 1990, conference and exhibit, Doubletree Hotel, New Orleans, LA. v. 3

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索取号：TN1-53/E901/1990.3
作者：IEEE Southeastcon (1990 : New Orleans、 La.)、IEEE Xplore (Online service)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1989

Conference proceedings

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索取号：TN1-53/E901/1987.1
作者：IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1987.

Conference proceedings

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索取号：TN1-53/E901/1987.2
作者：IEEE Southeastcon (1987 : Tampa、 Fla.)、Institute of Electrical and Electronics Engineers. Region 3.、
出版社：New York, NY : Institute of Electrical and Electronics Engineers, c1987.

Rational fault analysis

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索取号：TN106/E802
作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社：New York : M. Dekker, 1977.

Advanced scanning electron microscopy and X-ray microanalysis

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索取号：TN153/E901
作者：
出版社：New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

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索取号：TN153/E802
作者：Fryer、 J. R.、
出版社：London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

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索取号：TN153/E801
作者：
出版社：London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

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索取号：TN153-53/E804/1974
作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社：Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

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索取号：TN153-53/E801/10.3
作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

Semiconductor devices for power conditioning

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索取号：TN303-53/E901/1981
作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、
出版社：New York : Plenum Press, 1982.

NASECODE V [electronic resource] : proceedings of the Fifth International Conference on the Numerical Analysis of Semiconductor Devices and Integrated Circuits : 17-19 June 1987, Trinity College, Dublin, Ireland

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索取号：TN303-53/E902/5
作者：NASECODE Conference (5th : 1987 : Trinity College、 Dublin、 Ireland)、IEEE Xplore (Online service)、Miller、 John J. H.、
出版社：Dún Laoghaire : Boole, 1987

Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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索取号：TN304-53/E901/1985
作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、
出版社：Amsterdam ; New York : Elsevier, 1985.

Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.

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索取号：TN304-53/E903/2
作者：
出版社：New York : North-Holland, 1983.

New strategies in parasitology : proceedings of an international symposium, sponsored by Glaxo Research, Brocket Hall, Hertfordshire, 22-25 April 1989

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索取号：R53-53/E902/1989
作者：
出版社：Edinburgh ; New York : Churchill Livingstone, 1989.

The host-invader interplay : proceedings of the Third International Symposium on the Biochemistry of Parasites and Host-Parasite Relationships, Beerse, Belgium, 30 June 3-July, 1980

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索取号：R53-53/E901/3
作者：International Symposium on the Biochemistry of Parasites and Host-Parasite Relationships、 3d、 Beerse、 Belgium、 1980.、Bossche、 H. van den.、Janssen Research Foundation.、
出版社：Amsterdam ; New York : Elsevier/North-Holland Biomedical Press ; New York, N.Y. : sole distributors for the USA and Canada, Elsevier North-Holland, 1980.